New Particle Analysis module introduced by Renishaw

New Particle Analysis module introduced by Renishaw


  • Post By : Kumar Jeetendra

  • Source: Renishaw

  • Date: 17 Oct,2020

The module simplifies the inVia microscope so that it can identify particles on pictures and then analyse them using Raman spectroscopy.

Renishaw’s inVia Raman system has a high quality microscope that’s great for producing optical images of particles on surfaces. These images are utilized to direct Raman spectroscopy measurements that quickly give chemically specific, high spatial-resolution info.

The application module pinpoints multiple particles for automatic Raman analysis and reports the results in an easy-to-navigate format. This lets you easily spot correlations between particle size, shape and chemistry.

The new module also works with Renishaw’s Correlate™ module so that images from other microscopy systems can be used to guide Raman analyses on the inVia microscope.

The Particle Analysis module rapidly and comprehensively analyses multiple particles and can be used in many applications. David Reece, Marketing Manager for Renishaw’s Spectroscopy Products Division, said “Raman spectroscopy is being used increasingly for contamination detection, forensics, pharmaceutical products and microplastic analysis. Our new module enables the full investigation and reporting of morphological and chemical properties of particles. This will enable a deeper understanding of the particles, their properties and origins.”

The Particle Analysis software is an optional module for Renishaw’s WiRE™ 5.4 software, for use with the inVia confocal Raman microscope.

For further information on the Particle Analysis module, visit

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